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Keithley 2600-PCT-3


Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley’s line of high power Parametric Curve Trace configurations supports the full spectrum of device types and test parameters. Keithley’s Parametric Curve Trace configurations include everything necessary for the characterization engineer to develop a complete test system quickly. ACS Basic Edition software provides complete device characterization, including both real-time trace mode for quickly checking fundamental deivce parameters like breakdown voltage and full parametric mode for extracting precise device parameters. ACS Basic Edition goes beyond traditional curve tracer interfaces by offering a broad array of sample libraries. More important, users have complete control of all test resources, allowing the creation of more advanced tests than previously possible on a curve tracer.

Keithley’s Parametric Curve Trace configurations support both package part and wafer level testing.

Keithley’s Parametric Curve Trace configurations are complete characterization tools that include the key elements necessary for power device characterization. The measurement channels consist of Keithley SourceMeter® Source Measure Unit (SMU) Instruments and an optional Multi frequency capacitance-voltage (C-V) meter. The dynamic range and accuracy of these instruments is orders of magnitude beyond what a traditional curve tracer could offer.

Complete System Accessories

To achieve this performance, Keithley has developed a complete set of precision cables to connect the instrumentation to either Keithley’s Model 8010 High Power Device Test Fixture for package part testing, or the Model 8020 High Power Interface Panel for wafer level testing. For the high voltage channel, custom triax cables provide a guarded pathway that enables fast settling and very low currents, even at the full 3kV. For the high current channel, special low inductance cables provide fast rise time pulses to minimize self heating effects.

High Voltage Capacitance-Voltage (C-V)

Testing device capacitance versus DC voltage is becoming more and more important. Keithley offers the Model PCT-CVU Multi-frequency capacitance-voltage meter. When combined with the optional 200V or 3kV bias tees, capacitance vs. voltage can be measured on two, three or four terminal devices. Capacitances from pF to 100nF can be measured, with test frequencies from 10kHz to 2MHz. ACS Basic Edition software provides over 60 canned tests for C-V including MOSFET Ciss, Coss, Crss, Cgd, Cgs, Cds, and a full suite of other devices such as BJTs and diodes. As always, users have complete control to develop their own test algorithms in ACS Basic Edition.

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